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Preparation of zirconium oxide on silica and characterization by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, temperature programmed oxidation and infra-red spectroscopy

机译：在二氧化硅上制备氧化锆，并通过X射线光电子能谱，二次离子质谱，程序升温氧化和红外光谱进行表征

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Meijers, ACQM; Jong, de, AM Arthur; Gruijthuijsen, Leo van, LMP; Niemantsverdriet, JW Hans;
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年度 1991
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5. Characterization of novel polymers by time-of-flight secondary ion mass spectrometry, matrix-assisted laser desorption mass spectrometry, and x-ray photoelectron spectroscopy. [D] . Belu, Anna Marie. 1994

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8. Instrument Combining X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry for Surface Studies [R] . Hewitt, R. W., Shepard, A. T., Baitinger, W. E., 1978

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Preparation of zirconium oxide on silica and characterization by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, temperature programmed oxidation and infra-red spectroscopy

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